A ray-trace analysis of x-ray multilayer Laue lenses for nanometer focusing
نویسندگان
چکیده
منابع مشابه
Focusing with multilayer Laue lenses
1DESY, Notkestr. 85, 22607 Hamburg, Germany, 2CFEL at DESY, Notkestr. 85, 22607 Hamburg, Germany, 3Institute of Experimental Physics, University of Hamburg, Luruper Chaussee 149, 22761 Hamburg, Germany, 4SLAC National Accelerator Laboratory, 2575 Sand Hill Road MS 29, Menlo Park, CA 94025, USA, 5Faculty of Physics, University of Bialystok, ul. Lipowa 41, 15-424 Bialystok, Poland, 6European XFEL...
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ژورنال
عنوان ژورنال: Journal of Optics
سال: 2020
ISSN: 2040-8978,2040-8986
DOI: 10.1088/2040-8986/abb9c2